harden sensor acquisition after audit

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Jay
2026-08-17 09:48:05 -04:00
parent f1ac20fb4f
commit b8fe233ba6
11 changed files with 376 additions and 50 deletions
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@@ -4,10 +4,19 @@ The enclosure was tested with the battery end treated as the bottom of the
reference orientation. The shared enclosure frame is +X right, +Y toward the
top, and +Z toward the cover.
## Audit clarification
The timing results below validate the ESP32-C3 polling loop, not the independent
sensor sample clocks. A subsequent review of the capture found a coherent repeated
ADXL345 sample approximately every 27 polls, consistent with an actual device ODR
near 96.3 Hz. This does not affect the static six-position axis result. Firmware v2
adds ADXL345 and L3G4200D freshness/overrun status to every record so dynamic data
can be interpreted correctly.
## Capture integrity
- 50,001 consecutive samples over 500.000 seconds
- Effective sample rate: exactly 100 Hz
- Effective MCU polling rate: exactly 100 Hz
- Timestamp interval: 10,000 us for every sample
- Sequence gaps: 0
- Axis-mapping mismatches between mapped and native columns: 0